SHOW FULL COLUMNS FROM `moban_site` [ RunTime:0.000748s ]
SELECT * FROM `moban_site` WHERE `lang` = 'en' LIMIT 1 [ RunTime:0.000332s ]
SHOW FULL COLUMNS FROM `moban_columns` [ RunTime:0.000529s ]
SELECT * FROM `moban_columns` WHERE `state` = 1 AND `lang` = 'en' ORDER BY `sort` ASC [ RunTime:0.000374s ]
SHOW FULL COLUMNS FROM `moban_news` [ RunTime:0.000519s ]
SELECT * FROM `moban_news` WHERE `lang` = 'en' AND `state` = 1 LIMIT 1 [ RunTime:0.000446s ]
SHOW FULL COLUMNS FROM `moban_news_category` [ RunTime:0.000514s ]
SELECT * FROM `moban_news_category` WHERE `lang` = 'en' ORDER BY `id` ASC [ RunTime:0.000365s ]
SHOW FULL COLUMNS FROM `moban_single_page` [ RunTime:0.000525s ]
SELECT * FROM `moban_single_page` WHERE `id` IN (0,47) AND `state` = 1 AND `lang` = 'en' [ RunTime:0.000427s ]
SELECT * FROM `moban_single_page` WHERE `id` IN (3,0,26,28,29,30,31,34,36,37,38,41,42,43,44,46,50) AND `state` = 1 AND `lang` = 'en' [ RunTime:0.000505s ]
SELECT * FROM `moban_single_page` WHERE `id` IN (18,0,27,1,2,45) AND `state` = 1 AND `lang` = 'en' [ RunTime:0.000439s ]
SHOW FULL COLUMNS FROM `moban_link` [ RunTime:0.000501s ]
SELECT * FROM `moban_link` WHERE `state` = 1 ORDER BY `sort` ASC [ RunTime:0.000298s ]
SHOW FULL COLUMNS FROM `moban_products` [ RunTime:0.000985s ]
SELECT category_id,count(id) total FROM `moban_products` WHERE `state` = 1 GROUP BY `category_id` [ RunTime:0.000345s ]
SHOW FULL COLUMNS FROM `moban_category` [ RunTime:0.000516s ]
SELECT * FROM `moban_category` ORDER BY `id` ASC [ RunTime:0.000252s ]
[API] response: [200 OK] "{\"code\":200,\"msg\":\"请求成功\",\"data\":{\"categories\":[{\"id\":32,\"parent_id\":0,\"name\":\"Integrated Circuits (ICs)\",\"slug_name\":\"integrated-circuits-ics\",\"description\":\"Integrated circuits combine a large number of transistors and other elementary electronic components in miniaturized form into a single physical device, that is designed for a specific purpose or function and characterized by its performance of that function rather than by the behavior of its component pieces. Exam (truncated) ... [elapsed: 0.136334 secs]